News

Seminar R. Martonak 23/2/10
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4/2/10 Colloquium S. Lindsay
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18/1/10 Our work highlighted on Nanotech.org website.
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30/12/09 Our paper about atomic contrast of KPFM published in PRL
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Seminar J.P. Lewis 9/12/09 14:00
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Seminar P. Kocan 25/11/09 15:00
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14.-15.10. 2009 workshop "Simultaneous STM/AFM measurements using tuning fork based sensors"
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Theory of SPM

We aim to understand ongoing processes at atomic scale during SPM measurements. The detail knowledge of these processes is necessary for correct interpretation of experimental data and development of new techniques. We apply DFT total energy calculations to simulate complex interaction between SPM tip and sample But addressing these complex problems with a fully converged first-principles description would be still too computationally exigent and in many cases exceeding possibilities of nowadays high performance computers. Therefore we use a home-built fast local orbital DFT code Fireball devised with the aim of computational efficiency. Optionally, calculations are checked with more demand traditional plane-wave DFT methods. In particular, we are interested in these topics:

(i) single-atom chemical identification [1]

(ii) new procedures of atomic manipulations [2,3]

(iii) detail understanding of atomic-scale contrast [4]

(iv) energy dissipation at atomic scale [5].

  1. Y. Sugimoto, P. Pou, M. Abe, P. Jelinek, R. Perez, S. Morita and O. Custance, "Chemical identification of individual surface atoms by atomic force microscopy" Nature 446, 64 (2007).
  2. Y. Sugimoto, P. Jelinek, P. Pou, S. Morita and O. Custance, R. Perez and M. Abe, "Mechanism for room-temperature single atom lateral manipulations on semiconductors using dynamic force microscopy" Phys. Rev. Lett. 98, 106104 (2007).
  3. Y. Sugimoto, P. Pou, O. Custance, P. Jelinek, M. Abe, R. Perez, S. Morita “Complex Pattering by Vertical Interchange Atom Manipulation Using Atomic Force Microscopy” Science 322, 413 (2008).
  4. S. Sadewasser, P. Jelinek, C. Fang, O. Custance, Y. Yamada, Y. Sugimoto. M. Abe, S. Morita “New insights on atomic-resolution Frequency-Modulation Kelvin Probe Force Microscopy imaging on semiconductors” (submitted)
  5. N. Oyabu, P. Pou, Y. Sugimoto, P. Jelinek, M. Abe, S. Morita, R. Perez and O. Custance: "Single Atomic Contact Adhesion and Dissipation in Dynamic Force Microscopy" Phys. Rev. Lett. 96, 106101 (2006).