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Seminar-Peter Wahl
18/05/2011 15:00 (Seminarni mistnost budova A) »more info

Our paper published in PRL May 2011
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Colloquium - R. Moeller
28/04/2011 15:00 (Seminarni mistnost budova A) »more info

Colloquium - A. Heinrich
21/03/2011 15:00 (Seminarni mistnost budova A) »more info

Seminar - Petr Klapetek
14/02/2011 14:00 (Zasedaci mistnost budova B) »more info

Seminar - Guy Le Lay
11/02/2011 11:00 (Seminarni mistnost budova A) »more info

Our paper published in PRL Jan 2011
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Seminar András Berkó
15/11/2010 15:00 (Seminarni mistnost budova A) »more info

Seminar Martin Svec
14/11/2010 15:00 (Seminarni mistnost budova A) »more info

2nd QPlus workshop 8/10/10
2nd International QPlus Workshop 8.10.2010 »more info

Seminar Y. J. Dappe 25/5/10
25/5/2010 10:00 (Seminarni mistnost budova A) »more info

Seminar J. Repp 13/4/2010
14/3/2010 15:00 (Seminarni mistnost budova A) »more info

Seminar T. Novotny 2/3/2010
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Seminar R. Martonak 23/2/10
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4/2/10 Colloquium S. Lindsay
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18/1/10 Our work highlighted on Nanotech.org website.
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30/12/09 Our paper about atomic contrast of KPFM published in PRL
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Seminar J.P. Lewis 9/12/09 14:00
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Seminar P. Kocan 25/11/09 15:00
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14.-15.10. 2009 workshop "Simultaneous STM/AFM measurements using tuning fork based sensors"
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Our group studies fundamental phenomena in surface physics at the atomic length scale. Analysis, control and modification of molecules, surfaces or nanostructures are great challenges of last years. We aim to study semiconductor surfaces and metal-semiconductor or organic-semiconductor interfaces on the atomic and the nanoscopic scale. Reconstruction, relaxation and dynamics on a monocrystalline surface after a deposition of metal atoms are monitored as a function of temperature and coverage. In our group we combine following methods:

(i) nanoprobe technique (UHV VT STM/AFM)

(ii) photoelectron spectroscopy (the source of synchrotron radiation "Elettra", Trieste, Italy)

(iii) electron diffraction methods (LEED, SPA-LEED)

(iv) advanced theoretical analysis based on DFT simulations

(v) statistical mechanics (kinetic Monte Carlo, MD, rate equations model)

The combination of these techniques allows state-of-art complex analysis of studied processes and systems.