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instrumentation
AFM/STM Nanoscope IIIa Multimode (Bruker), Topometrix TMX 2010 (Bruker)
Scanning Probe Microscopy in situ SPM
Potentiostat/galvanostat: Wenking POS 2 (Bank Elektronik)
Potentiostat HEKA
Nanobubble generator
Czech
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