Patent database

The Institute of Physics of the Czech Academy of Sciences offers its portfolio of Czech and international patents. Patent applications are prepared by an institutional Patent Attorney, who acts as a Czech and European representative. A license to use industrial rights is usually granted as non-exclusive, but other forms are possible on the basis of individual negotiations. Licenses are arranged by the Knowledge and Technology Transfer group.

  1. B. Rus, Martin Horáček, Jiří Thoma, Lucie Koubíková, Jack A. Naylon
    Damage detection module - Health monitoring of optical components
  2. B. Rus, M. Horáček, J. A. Naylon
    Temperature, humidity and water leak detection system
  3. B. Rus, D. Kramer
    LIDT test station (Laser Induced Damage Threshold)
  4. B. Rus, G. Kalinchenko
    Encode image technique - Artificially tailored metasurface materials for the telecommunication industry
  5. B. Rus, P. Bakule, S. Reyné, F. Giambruno, J. Nejdl
    Vacuum chamber suitable for Laser Printing
  6. B. Rus, P. Bakule
    Off-axis parabolic mirrors
  7. J. A. Naylon, F. Batysta, R. Antipenkov, J. Novák, J. Horáček, M. Horáček, Z. Hubka, R. Boge, T. Mazanec, B. Himmel, P. Bakule, B. Rus
    Pulse shape device - Waveform synthesizer
  8. F. Batysta, P. Bakule, R. Antipenkov, J.A. Nylon, R. Boge, J. Novák, T. Mazanec, B. Rus, D. Kramer, P. Strkula, Z. Hrubka, V. Šobr, L. Brabec
    L1 oscilator
  9. B. Rus, D. Snopek
    Motorized positioning system
  10. G. Korn, P. Bastl
    Foil Holder
  11. B. Rus, M. Fibrich, M. Horáček, J. Naylon
    Damage control system
  12. P. Boháč, K. Cvrk, M. Veselský, J. Tomáštík, R. Čtvrtlík, V. Koula, M. Hrabovský, L. Jastrabík
    Kit for capture, transformation and digitization of acoustic emission during the scratch test of thin films
  13. I. Kratochvílová, F. Fendrych
    Polycrystalline diamond layer for protection of zirkonium alloys M5
  14. Z. Hubička, V. Straňák, J. Šmíd, J. Olejníček, M. Čada, P. Adámek, Š. Kment, A. Kromka
    Hybrid plasma nozzle with surface wave for exciting extremely reactive discharges
  15. J. Hanuš, A. Richter, P. Rydlo, L. Heller
    Pressure and/or force sensor
  16. O. Churpita, A. Dejneka, V. Zablotskyy, Š. Kubinová, E. Syková
    Atmospheric plasma source, particularly for use in medicinal bioapplications
  17. P. Adámek, M. Čada, Z. Hubička, L. Jastrabík, J. Adámek, J. Stöckel
    A method for measuring the ion distribution function in a low temperature plasma, a measuring system for implementing the method and the probe for measuring system
  18. L. Havlák, V. Jarý, M. Nikl, J. Bárta, P. Boháček
    Inorganic scintillator or phosphor based on KLuS2:Eu
  19. L. Havlák, V. Jarý, M. Nikl, J. Bárta, P. Boháček
    Inorganic scintillator based on KLuS2:Ce
  20. P. Straka, M. Smrž
    Stray modulation unit
  21. P. Straka, M. Smrž
    Dispersoscop
  22. R.Škoda, J. Škarohlíd, I. Kratochvílová, A. Taylor, F. Fendrych
    Surface protection of zirconium nuclear fuel tubes.
  23. M. Kocián, S. Kamba
    Phactor - device for measurements of dielectric loss tan($\delta$)
  24. R. Hříbal, O. Rezek, T. Ižák, E. Ukraintsev, B. Rezek
    System for simultaneous measurement of optical and electrical characteristics of samples of biological materials in solution
  25. B. Rezek, A. Kromka, O. Babčenko, J. Libertínová, J. P. Conde, V. Chu, T. Schmiedinger
    Microfluidic system for electrical measurements
  26. O. Churpita, A. Dejneka, V. Zablotskyy, Š. Kubinová, E. Syková
    Low-temperature plasma source, particularly for deactivation of bacteria
  27. P. Adámek, J. Olejníček, M. Čada, Z. Hubička, Š. Kment
    Solar Cell I-V Curve Measurement System
  28. Z. Hubička, M. Čada, P. Adámek
    Multifunctional substrate holder for plasma depositions of optical thin films
  29. P. Boháč, K. Cvrk, M. Veselský, J. Tomáštík, L. Jastrabík, V. Koula
    Laboratory equipment for adhesion testing of thin films to substrates using acoustic emission record for evaluation
  30. D. Vokoun, M. Beleggia
    Quiet magnetic velcro fastenner
  31. P. Boháč, K. Cvrk, M. Veselský, J. Tomáštík, L. Jastrabík, V. Koula
    A measuring extension on sample holder for diagnostic equipment allowing to scan acoustic emission during scratch test
  32. P. Boháč, M. Veselský, K. Cvrk, J. Tomáštík, R. Čtvrtlík, L. Jastrabík, V. Koula
    The duralumin adapter to sample holder with an integrated sensor of acoustic emission generated by scratch test
  33. P. Boháč, M. Veselský, K. Cvrk, J. Tomáštík, R. Čtvrtlík, L. Jastrabík, V. Koula
    Measuring head for nanotester NT600, which allows the scanning of acoustic emission with increased sensitivity
  34. P. Boháč, M. Dráb, J. Tomáštík, R. Čtvrtlík
    Software utility “envelope”
  35. V. Jirásek, Š. Potocký, A. Sveshnikov
    GENERAL METHODOLOGY FOR HIGH TEMPERATURE PROCESSES OF SEMICONDUCTOR TECHNOLOGY BY THE FINITE ELEMENT METHODS
  36. P. Adámek, M. Čada, Z. Hubička, L. Jastrabík, Š. Kment, J. Olejníček
    A method of measurement synchronisation for plasma probe diagnostics and measuring system for conducting this method
  37. A. Hospodková, J. Pangrác, J. Oswald
    Gallium arsenide antimonite layer with graded composition for reducing strain in indium arsenide/gallium arsenide quantum dots
  38. K. Kůsová, O. Cibulka, K. Dohnalová, K. Žídek, A. Fučíková a I.Pelant
    Methods for the preparation of optically clear solutions of silicon nanocrystals with short-wavelength luminescence
  39. H. Kozak, Z. Remeš, O. Babčenko, A. Kromka, M. Varga
    Multilayer optical system for detection of infrared spectra of functionalized diamond surfaces
  40. Z. Hubička, M. Čada, T. Kubart, P. Adámek, J. Olejníček, Š. Kment
    System for measurement of ion and neutral particles flux deposited onto substrate during thin film deposition process
  41. P. Adámek, M. Čada, Z. Hubička, Š. Kment, J. Olejníček
    Measuring system for microwave plasma diagnostics
  42. O. Churpita, A. Dejneka, V. Zablotskyy, Š. Kubinová, E. Syková
    Atmospheric plasma source for biomedical applications
  43. P. Adámek, M. Čada, Z. Hubička, Š. Kment, J. Olejníček
    Programmable system for monitoring and control of thin film deposition plasma systems
  44. P. Adámek, M. Čada, Z. Hubička, Š. Kment, J. Olejníček, P. Lukašík, A. Piják
    Acquisition system for time-resolved the Langmuir probe diagnostics of discharges
  45. P. Adámek, M. Čada, Z. Hubička, Š. Kment, P. Lukašík, J. Olejníček, A. Piják
    Programmable Dip-Coater for deposition of thin films in chemical solutions
  46. P. Adámek, M. Čada, Z. Hubička, L. Jastrabík
    Measuring system for microwave diagnostic of the plasma.
  47. P. Adámek, Z. Hubička, Š. Kment, M. Čada, L. Jastrabík
    Control and monitoring software for plasma depositon control system.
  48. Z. Hubička, M. Čada, P. Adámek, Š. Kment, J. Olejníček
    An apparatus for neutral and ion flux measurement on substrate in a low-temperature plasma
  49. J. Wunderlich, T. Jungwirth, A. Irvine, J. Sinova
    Spin-polarised charge carrier device
  50. J. Bárta, V. Čuba, V. Múčka, M. Nikl, M. Pospíšil
    Process for preparing synthetic structures based on lutetium-aluminium garnet (LuAG))